Test Probe B (Jointed Test Finger)

1.Introduction

Test Probe B (Jointed Test Finger) is designed according to IEC61032 figure 2, and can meet the test requirements of IEC60529 and IEC60065. The probe consists by dactylogryposis and handle. The dactylogrypossis has two active joints that can bend in 90 degrees. The finger part is made of steel material, the handle is made of nylon, and has a terminals of M6 threaded hole to work with force gauge. Or the probe can built-in 50N thruster to apply appropriate force directly during the test. The test probe B is to simulate the person’s finger, to evaluate the protection of person’s finger from hazard parts (Live parts or mechanical parts) of enclosure.

Test probe B is the IP code probe for IP2X testing, and its deformed probes are applied to different product standards, such as similar test probe B with 50mm circular stop face and similar test probe B with 125mm circular stop face.

2. Specification