Low Temperature Impact Test Apparatus
Overview

The low temperature imapct test apparatus is designed to meet the test requirements of IEC60884-1 clause24.4 / figure 27 and clause 30.4 / figure 42 for testing the mechanical strength of pin-insulating sleeves,  plug, socket-outlets and etc..

IEC60884-1 Apparatus for Impact Test at Low Temperature

1.Introduction

Low temperature impact test apparatus is designed according to IEC60884-1 clause24.4/figure 27, and clause 30.4/figure 42, VDE0620. The apparatus should work with low temperature chamber, and it should be placed on a 40mm thick sponge rubber pad. This apparatus is to perform an impact test from a height of of 100mm with a falling weight of 100g or 1000g to pin-insulating sleeves, plug and socket-outlets at a low temperature to meet the test requirements of IEC60884-1 clauses 24.4 and 30.4, after the test, no cracks of the insulating sleeves shall be visible with normal or corrected vision without addition magnification, and no damages shall be shown on the sample.

 

2. Specification

ModelPG-LTI-1
Working Station1
Falling weight100g, 1000g
Falling impact height100mm
Steel blockΦ20, bottom arc: R300, 100g
Cool time

>24h for pin-insulating sleeves

>16h for plug and socket-outlet

Test temperature(-15±2)℃
Steel supportThickness: 40mm, Weight: 10±1KG
Release modeManual, mechanical release
Standard conform toIEC60884-1 clauses 24.4 and 30.4, figures 27 and 42
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